
MAX1392/MAX1395
Aperture Delay
The MAX1392/MAX1395 sample data on the falling
edge of its third SCLK cycle (Figure 14). In actuality,
there is a small delay between the falling edge of the
sampling clock and the actual sampling instant.
Aperture delay (tAD) is the time defined between the
falling edge of the sampling clock and the instant when
an actual sample is taken.
Aperture Jitter
Aperture jitter (tAJ) is the sample-to-sample variation in
the aperture delay (Figure 14).
DC Power-Supply Rejection Ratio (PSRR)
DC PSRR is defined as the change in the positive full-
scale transfer function point caused by a full range vari-
ation in the analog power-supply voltage (VDD).
16
______________________________________________________________________________________
1.5V to 3.6V, 357ksps, 1-Channel True-Differential/
2-Channel Single-Ended, 10-Bit, SAR ADCs
tAD
T/H
(INTERNAL
SIGNAL)
SCLK
tAJ
TRACK
HOLD
ANALOG
INPUT
SAMPLED
DATA
THIRD FALLING EDGE
Figure 14. T/H Aperture Timing
AIN+ (AIN1)*
DOUT
SCLK
AIN- (AIN2)*
REF
INPUT
VOLTAGE
*INDICATES THE MAX1395 ONLY
2 x AA CELLS
CPU
+
-
VDD
GND
REF
INPUT
VOLTAGE
0.1
μF
0.1
μF
CS
OE
UNI/BIP
(CH1/CH2)*
MISO
SCL
SS
MAX1392
MAX1395
Typical Operating Circuit
Chip Information
TRANSISTOR COUNT: 9106
PROCESS: BiCMOS